MITECH MH660 Leeb Hardness Tester

Rp26.714.286

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Mitech MH660 Leeb Hardness Tester

Product Overview

The Mitech MH660 is a new-generation portable Leeb hardness tester, designed with enhanced user experience and high-performance features for efficient on-site metal hardness measurement. This instrument is engineered for rugged industrial environments, boasting a sealed aluminum-magnesium alloy body, a bright 320×240 color LCD, and long-lasting battery life.

Whether for quality control, failure analysis, or in-service inspections, the MH660 supports multi-directional hardness testing with automatic direction detection, multi-scale conversion, and high data precision. Built-in Bluetooth connectivity enables quick report printing and seamless integration with PC software for data management and advanced statistical analysis.

Ideal for testing large, non-removable metal components in fields such as metal processing, aerospace, automotive, energy, and heavy machinery.


Key Features

  • Multi-Scale Conversion: Converts to HL, HB, HRB, HRC, HRA, HV, and HS. Also supports conversions among Leeb scales (HLD, HLC, HLG, HLDL, HLD+15).

  • Wide Measurement Range: 170–960 HLD with an accuracy of ±6 HLD.

  • Automatic Functions: Auto direction detection, out-of-range alarms, auto sleep, auto shutdown, and standby mode.

  • Color LCD Screen: 320 × 240 resolution for clear readability in all lighting conditions.

  • High Capacity Storage: Stores up to 500 test series with full data including date, time, material, hardness values, and impact direction.

  • Bluetooth Printing: Compatible with a field printer for instant report generation.

  • USB Data Transfer: For exporting results, configuring settings, and generating reports via PC software.

  • Compact and Durable: Rugged metal shell with IP-grade sealing to resist dust, oil, moisture, and other contaminants.

  • Efficient Power Use: Powered by 2 AA batteries; up to 300 hours of operation.

  • Multi-Language Support: Chinese and English interface for global usability.

  • Original Point and Multi-Point Calibration: Ensures accurate conversion curves and reduces measurement error.


Applications

  • Die cavity testing in molds

  • Bearings, gears, and machined parts

  • Failure analysis of pressure vessels and boilers

  • Hardness checks on large, installed, or immovable components

  • Small or confined testing areas

  • Batch inspection during production

  • Scrap metal classification

  • Quality assurance for stored metallic materials


Working Principle

The MH660 uses Leeb rebound testing:
A known mass is propelled toward the test surface; the instrument then measures the impact velocity (VA) and the rebound velocity (VB) to calculate hardness:

HL = 1000 × VB / VA

This non-destructive method ensures rapid and repeatable testing across various materials and orientations.


Working Environment

  • Operating Temperature: -10°C to +50°C

  • Storage Temperature: -30°C to +60°C

  • Humidity: ≤90% RH

  • Avoid strong vibrations, magnetic fields, corrosive environments, and heavy dust.


Operating Instructions 

  1. Connect the Impact Device: Plug in before powering on.

  2. Load the Impact Body: Push the loading tube and release slowly.

  3. Position the Device: Ensure perpendicular contact with the test surface.

  4. Start Testing: Press the release button; stable operation ensures accurate results.

  5. Read and Save Results: Automatic display of results after each test; average values are shown after preset impacts.

  6. Use with Care: Replace the impact device only when powered off to avoid hardware damage.

  7. Calibration: Follow specific procedures for multi-point calibration or material-specific conversion.


Maintenance Tips

  • Clean the guide tube and impact body every 1000–2000 uses with the included nylon brush.

  • Avoid using lubricants or solvents inside the impact device.

  • Release the impact body after use to prevent wear.

  • Store in a cool, dry place when not in use.

  • For accurate performance, regularly inspect and calibrate the device as needed.

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