Jual Stark Coating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys ACZET
StarK XRF is a high-performance, cost-effective solution for gold and precious metals analysis in the jewelry industry. Utilizing next-generation technology, the latest detectors, and sophisticated software, StarK XRF accurately identifies the elements present in a sample. Developed through years of product development and user feedback, StarK offers fast, easy, and high-performance XRF analysis designed to meet the strictest customer specifications. Its smart, compact design makes it convenient for various applications, all at an affordable price, maximizing your quality control ROI.
StarK is a non-destructive solution that determines the chemical composition of various sample types, including solids, liquids, and powders. Combining high precision and accuracy, StarK can be readily automated for use in industrial environments, offering:
- Powerful analysis with smart design
- Easy and simple user interface
- Compact, convenient, powerful performance
StarK excels in quick and precise materials analysis and user-friendly handling, especially for analyzing precious metals and gold alloys. With numerous advantages over competing products and technologies, StarK delivers the best performance, a wide analysis range, and the best repeatability in the industry.
Stark Coating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys ACZET Spesifications :
- Measuring Direction: Bottom to Top
- Applied Application: Coating Thickness Measurement on Metals, Gold & Silver Analysis in jewelry and alloys
- X-ray Tube: Min-focus, high performance, W-target, spot 0.2mm-0.8mm
- High Voltage: 50kV (1.2mA) Software Control Optimized
- Detector: High resolution Gas Filled Prop Counter / Silicon Pin Detector / Silicon Drift Detector
- Measurement Time: 60 sec. to 180 sec.
- Collimator: 0.3mmØ or 0.5mmØ
- Multi Collimator: 0.3mmØ or 0.5mmØ, Optional four positions Collimator changer
- Sample Stage: Fixed Sample Positioning
- Power Supply: 230VAC, 50/60Hz, 120W / 100W
- Inside Chamber: 330 x 200 x 170 mm (WxDxH)
- Dimension (LxWxH) mm: 500 x 652 x 500 mm (W x D x H)
- Weight approx.: 32 kg
This model of the Stark XRF analyzer is specifically designed for coating thickness measurement on metals and analysis of gold and silver in jewelry and alloys. It features a high-performance X-ray tube with a W-target and precise spot size capabilities, along with optimized software control for efficient operation. The detector options include high-resolution Gas Filled Prop Counter, Silicon Pin Detector, or Silicon Drift Detector for accurate elemental analysis.
The instrument supports multiple collimator sizes and configurations, offering flexibility in sample analysis. With a fixed sample positioning stage and a compact design, it ensures ease of use and reliability in industrial applications. The Stark XRF analyzer operates on a standard 230VAC power supply, making it suitable for various working environments.
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